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    Gaining Deeper Insights into Thin Film Response

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Agilent Cary Universal Measurement Accessory (UMA)

    Technical notes
    | 2013 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Optical Characterization of Thin Films

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Spectrophotometric Spatial Profiling of Coated Optical Wafers

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Unattended, Automated Measurements of Optical Components in a Production Environment

    Technical notes
    | 2018 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    High Volume Optical Component Testing

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    The Automation of Microscopic Analyses: Ease of Use

    Technical notes
    | N/A | Agilent Technologies
    FTIR Spectroscopy, Microscopy
    Instrumentation
    FTIR Spectroscopy, Microscopy
    Manufacturer
    Agilent Technologies
    Industries

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Optical Characterization of Materials Using Spectroscopy

    Guides
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing, Semiconductor Analysis

    Spectrophotometric Methods of Refractive Indices Measurement

    Applications
    | 2019 | Agilent Technologies
    Fluorescence spectroscopy
    Instrumentation
    Fluorescence spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
     

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