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    ANALYSIS OF PROPYLENE IMPURITIES USING SELECT LOW SULFUR COLUMN AND SINGLE TUNE WITH GC-ICP-MS QQQ ORS

    Others
    | 2016 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Continuous TOC determination in environmental analysis

    Others
    | 2005 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Environmental

    ICP-MS MassHunter WorkStation Software (G7201A) for the Agilent 7700 Series ICP-MS

    Technical notes
    | 2011 | Agilent Technologies
    Software, ICP/MS
    Instrumentation
    Software, ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    Agilent ICP-MS Journal (June 2007 – Issue 31)

    Others
    | 2007 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Clinical Research

    Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

    Applications
    | 2016 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Semiconductor Analysis

    Simple, Rapid Analysis of Trace Metals in Foods Using the Agilent 7700x ICP-MS

    Applications
    | 2009 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Food & Agriculture

    APWC: Arsenic(As) and Selenium(Se) analysis in presence of Rare Earth Elements (REEs) by single quadrupole ICP-MS

    Posters
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Food & Agriculture

    Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ

    Applications
    | 2016 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2013 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    WCPS: Determination of ultra-trace level impurities in high-purity metal samples by ICP-QQQ

    Posters
    | 2017 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing
     

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