X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films