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    Optical Characterization of Thin Films

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

    Applications
    | 2018 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Quality Control of Beam Splitters and Quarter-Wave-Mirrors

    Technical notes
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Optical Characteristics and Thickness of 2-layered Structures

    Applications
    | 2018 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    The determination of thin film thickness using reflectance spectroscopy

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface

    Applications
    | 2011 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

    Applications
    | 2021 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    EDXRF Analysis of Polymer Film

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Direct Identification of Packaged Substances using the Agilent Resolve Handheld Raman Analyzer

    Applications
    | 2023 | Agilent Technologies
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Forensics
     

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