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    Non-Destructive Analysis of Substrates and Contaminants by FTIR with Specular Reflectance Interface

    Applications
    | 2023 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Optical Characteristics and Thickness of 2-layered Structures

    Applications
    | 2018 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Surface Enhanced Raman Scattering (SERS) – Expanding the Limits of Conventional Raman Analysis

    Technical notes
    | 2018 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries

    FTIR talk letter vol. 17

    Others
    | 2012 | Shimadzu
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    In situ, fast and sensitive: Electrochemical SERS with screen-printed electrodes

    Applications
    | N/A | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing

    Surface Enhanced Raman Spectroscopy Analysis of Low Concentration Fentanyl Street Samples

    Applications
    | 2023 | Agilent Technologies
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Forensics

    Fast measurement of bio- chemical methane potential (BMP) by NIRS

    Applications
    | N/A | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Energy & Chemicals

    Determination of Heroin in Street Drug Samples

    Technical notes
    | 2021 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Forensics

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Analysis of CIGS Solar Cell by ICPE-9000

    Applications
    | N/A | Shimadzu
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Shimadzu
    Industries
    Materials Testing
     

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