Library | LabRulez ICPMS

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

AGILENT 7900 ICP-MS

Posters

| 2014 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

AGILENT 8900 TRIPLE QUADRUPOLE ICP-MS - LEAVE INTERFERENCES BEHIND WITH MS/MS

Posters

| 2016 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Agilent 7700 Series ICP-MS

Brochures and specifications

| 2010 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Metrohm TacticID-1064 ST handheld Raman spectrometer

Brochures and specifications

| 2020 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Forensics , Homeland Security

See-Through Measurements of Illicit Substances in Commercial Containers with the TacticID-1064 ST

Applications

| N/A | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Forensics

Agilent 7900 ICP-MS brochure

Brochures and specifications

| 2024 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Others

Agilent 8800 Triple Quadrupole ICP-MS

Brochures and specifications

| 2015 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

AGILENT 7900 ICP-MS

AGILENT 8900 TRIPLE QUADRUPOLE ICP-MS - LEAVE INTERFERENCES BEHIND WITH MS/MS

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Agilent 7700 Series ICP-MS

Metrohm TacticID-1064 ST handheld Raman spectrometer

See-Through Measurements of Illicit Substances in Commercial Containers with the TacticID-1064 ST

Agilent 7900 ICP-MS brochure

Agilent 8800 Triple Quadrupole ICP-MS

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

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