Library | LabRulez ICPMS

Drying of Aerogels with Supercritical Carbon Dioxide

Applications

| N/A | Applied Separations

Sample Preparation

Instrumentation

Sample Preparation

Manufacturer

Industries

Energy & Chemicals

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700

Technical notes

| N/A | Shimadzu

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Measuring the Optical Properties of Photovoltaic Cells

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Drying of Aerogels with Supercritical Carbon Dioxide

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

The determination of thin film thickness using reflectance spectroscopy

Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700

Measuring the Optical Properties of Photovoltaic Cells

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

The deep ultraviolet spectroscopic properties of a next-generation photoresist

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Low reflectance measurements using the ‘VW’ technique

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