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    Calibration model transfer of caffeine on the NIRS XDS Rapid Content Analyzer

    Technical notes
    | N/A | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction

    Technical notes
    | 2014 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Chromium Speciation of Drinking Waters by IC-ICP-MS

    Posters
    | 2021 | Shimadzu (Pittcon)
    Ion chromatography, ICP/MS, Speciation analysis
    Instrumentation
    Ion chromatography, ICP/MS, Speciation analysis
    Manufacturer
    Shimadzu
    Industries
    Environmental

    WCPS: Element-specific examination of volatile halogenated organics in wastewater extracts using GC-ICP-MS

    Posters
    | N/A | Agilent Technologies
    GC, ICP/MS, Speciation analysis
    Instrumentation
    GC, ICP/MS, Speciation analysis
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Agilent 7900 ICP-MS brochure

    Brochures and specifications
    | 2020 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    General Features of the New Agilent 7500 ICP-MS

    Brochures and specifications
    | 2000 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    Element-specific examination of volatile halogenated organics in wastewater extracts using GC-ICP-MS

    Posters
    | N/A | Agilent Technologies
    GC, ICP/MS, Speciation analysis
    Instrumentation
    GC, ICP/MS, Speciation analysis
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

    Applications
    | 2003 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    WCPS: Fundamental Studies of a Nitrogen Microwave Plasma for Analytical Emission Spectroscopy

    Posters
    | 2017 | Agilent Technologies
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Agilent Technologies
    Industries

    The Linear Dynamic Range and Limits of Detection of Fluorescein using the Agilent Cary Eclipse Fluorescence Spectrophotometer

    Technical notes
    | 2014 | Agilent Technologies
    Fluorescence spectroscopy
    Instrumentation
    Fluorescence spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
     

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