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    Agilent 4210 MP-AES

    Brochures and specifications
    | 2019 | Agilent Technologies
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Agilent Technologies
    Industries

    Agilent 4200 Microwave Plasma-Atomic Emission Spectrometer

    Brochures and specifications
    | 2015 | Agilent Technologies
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Agilent Technologies
    Industries

    ‘Fitted’ — Fast, accurate and fully- automated background correction

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

    Technical notes
    | 2019 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    ICP Expert II Software and ICP Expert II with 21 CFR Part 11 Software Status Bulletin

    Manuals
    | 2013 | Agilent Technologies
    Software, ICP/OES
    Instrumentation
    Software, ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Determination of 22 Elements Following US EPA Guidelines with a New Megapixel CCD ICP-OES

    Applications
    | 2010 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction

    Technical notes
    | 2014 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    ORS4 AND HELIUM MODE FOR MORE EFFECTIVE INTERFERENCE REMOVAL IN COMPLEX SAMPLES

    Others
    | 2015 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    NEMC: Overcoming interferences in challenging sample matrices using ICP-OES

    Posters
    | 2022 | Thermo Fisher Scientific
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Environmental

    Dealing with Matrix Interferences in the Determination of the Priority Pollutant Metals by Furnace AA

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental
     

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