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Make cone inspection more reliable and less of a chore
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| 2018 | Agilent Technologies
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WCPS: Enhancing Helium Mode Performance to Provide Improved Detection Limits for Difficult Elements Including S, P, Fe, and Se
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| 2011 | Agilent Technologies
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| 2021 | Wiley
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| 2023 | Wiley
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Contaminant Analysis Using EDXIR-Analysis Software for Combined EDX-FTIR Analysis
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Method Manager for Streamlined Statistical Analysis and Model Building
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| 2020 | Agilent Technologies
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Agilent FTIR Forensics Analyzer Package: Lab-Quality FTIR ATR Analyzers, Inside or Outside the Lab
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Shimadzu FTIR TALK LETTER - Vol. 40
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| 2023 | Shimadzu
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