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Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
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| 2003 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
Measuring the formation of DNP using an Agilent Cary 60 UV-Vis spectrophotometer and SFA 20 stoppedfl ow accessory
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| 2012 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
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Energy & Chemicals
Five Benefits of a Cloud ELN
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| 2018 | PerkinElmer
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PerkinElmer
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Determination of metals in industrial wastewaters by microwave plasma- atomic emission spectrometry
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| 2011 | Agilent Technologies
MP/ICP-AES
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MP/ICP-AES
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Agilent Technologies
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Environmental
Fluoropolymer Bottle Extractables Profile
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| 2022 | Savillex
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Savillex
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Determination of USP Heparin Units using near-infrared spectroscopy (NIRS)
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| 2017 | Metrohm
NIR Spectroscopy
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NIR Spectroscopy
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Metrohm
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Pharma & Biopharma
AutoMax — Fast, automated method optimization
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| 2010 | Agilent Technologies
ICP/OES
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ICP/OES
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Agilent Technologies
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Verifying Raw Materials by Spatially Offset Raman Spectroscopy
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| 2018 | Agilent Technologies
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Agilent Technologies
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Materials Testing
ON THE SEPARATION AND STRENGTHENING OF THE IMAGE BEHIND THE MIRROR (DERACEMIZATION AND CHIRALITY AMPLIFICATION)
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| 2023 | Chemické listy
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Iron Man
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| 2017 | Agilent Technologies
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Agilent Technologies
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