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Digital Signal Processing in Polarization Modulation - Infrared Reflection Absorption Measurements
Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
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Agilent Technologies
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Noise Pollution in the Laboratory
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| 2013 | Parker Hannifin
Instrumentation
Manufacturer
Industries
Analysis of 15 nm Iron Nanoparticles in Organic Solvents by spICP-MS
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| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ
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| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Shimadzu PDA-8000 Optical Emission Spectrometer
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| 2019 | Shimadzu
Optical Emission Spectroscopy
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Optical Emission Spectroscopy
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Shimadzu
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Automated FT-IR screening method for cocaine identification in seized drug samples
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| 2016 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Multi-element determination in populations of single cells by quadrupole ICP-MS
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| 2017 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Clinical Research
Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode
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| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
AGILENT 8900 TRIPLE QUADRUPOLE ICP-MS - LEAVE INTERFERENCES BEHIND WITH MS/MS
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| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
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| 2010 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
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