Quantitative analysis of tint in polymer pellets and disks
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
CO2 determination in beer
Applications
| 2006 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Food & Agriculture
The ultratrace determination of iodine 129 in aqueous samples using the 7700x ICP-MS with oxygen reaction mode
Applications
| 2013 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Automated Analysis of Low-to-High Matrix Environmental Samples Using a Single ICP-MS Method
Applications
| 2024 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Determination of High Concentration Sodium by Flame Atomic Absorption Spectrophotometry (FAAS) at Different Wavelengths
Applications
| 2016 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Pharma & Biopharma
Analysis of Electroceramics by Laser Ablation ICP-MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Sequential Determination of Cd, Cu, Pb, Co and Ni in Marine Invertebrates by Zeeman Graphite Furnace Atomic Absorption Spectroscopy
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture
Analysis of Mercury in Cosmetics by Cold Vapour Atomic Absorption Spectroscopy (CVAAS)
Applications
| 2020 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Others
Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS