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Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
Applications
| N/A | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Shimadzu
Industries
Materials Testing
Optimal matrix application methods for MS imaging
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| 2022 | Shimadzu
MALDI, MS Imaging, Microscopy
Instrumentation
MALDI, MS Imaging, Microscopy
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Shimadzu
Industries
Evaluation of Three Methods of Matrix Modifier Injection in Graphite Furnace AAS
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| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
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Agilent Technologies
Industries
Imaging Mass Microscope iMScope QT
Brochures and specifications
| 2023 | Shimadzu
LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, Microscopy
Instrumentation
LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, Microscopy
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Shimadzu
Industries
Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards
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| 2018 | Shimadzu
X-ray
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X-ray
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Shimadzu
Industries
Materials Testing
Revealing battery secrets with ECRaman solutions
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| 2023 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
EDXRF Analysis of PM2.5 (Particle Matter)
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| 2013 | Shimadzu
X-ray
Instrumentation
X-ray
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Shimadzu
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
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| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Low-frequency Raman spectroscopy
Applications
| 2023 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
The ICP-MS Vacuum Interface
Technical notes
| 2022 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
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