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| 2021 | Savillex
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Release Notes for Agilent ICP Expert Version 7.3.1
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| 2017 | Agilent Technologies
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Release Notes for Agilent ICP Expert Version 7.4.1
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| 2018 | Agilent Technologies
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Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
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| 2014 | Agilent Technologies
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Microfocus X-Ray CT System inspeXio SMX-225CT FPD HR Plus
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Inspection of Defects in an Automotive Inverter Component with X-Ray Inspection System
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Shimadzu
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Agilent Cary 610/620 FTIR microscopes and imaging systems
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| 2014 | Agilent Technologies
FTIR Spectroscopy, Microscopy
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Agilent Technologies
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Characterization of single-walled carbon nanotubes by Raman spectroelectrochemistry
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| 2019 | Metrohm
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Metrohm
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Materials Testing
An Example of Observing Reduction Gear Using the Microfocus X-Ray CT System
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| 2023 | Shimadzu
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Shimadzu
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Materials Testing
Analysis of residual moisture in a lyophilized pharmaceutical product by near-infrared spectroscopy
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| N/A | Metrohm
NIR Spectroscopy
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NIR Spectroscopy
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Metrohm
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