Library | LabRulez ICPMS

Leveraging Cl-H Mass Defect Plots for the Identification of Halogenated Organic Contaminants

Posters

| 2016 | LECO

GC/MSD, GC/HRMS, GC/TOF

Instrumentation

GC/MSD, GC/HRMS, GC/TOF

Manufacturer

Agilent Technologies, LECO

Industries

Environmental

Post-Target Analysis of Halogenated Flame Retardants Using Mass Defect Plots

Posters

| 2014 | LECO

GC/MSD, GC/HRMS, GC/TOF

Instrumentation

GC/MSD, GC/HRMS, GC/TOF

Manufacturer

Agilent Technologies, LECO

Industries

Environmental

Analysis of defective POM machine parts

Applications

| N/A | Frontier Lab

GC/MSD, Pyrolysis

Instrumentation

GC/MSD, Pyrolysis

Manufacturer

Frontier Lab

Industries

Materials Testing

Analysis of defective POM machine parts

Applications

| N/A | Frontier Lab

GC/MSD, Pyrolysis

Instrumentation

GC/MSD, Pyrolysis

Manufacturer

Frontier Lab

Industries

Materials Testing

Spectral Analysis Tools (SAT) Option for LECO Pegasus® GC-HRT+

Brochures and specifications

| 2019 | LECO

GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

LECO

Industries

Defect analysis of electronic devices - clouded optical components

Applications

| N/A | Frontier Lab

GC/MSD, Thermal desorption

Instrumentation

GC/MSD, Thermal desorption

Manufacturer

Frontier Lab

Industries

Materials Testing

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications

| N/A | ZOEX/JSB

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

JEOL, ZOEX/JSB

Industries

Materials Testing, Semiconductor Analysis

GC-APCI IMS of Diesel

Applications

| 2015 | Agilent Technologies

GC/MSD, GC/MS/MS, GC/HRMS, GC/TOF, GC/API/MS, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS

Instrumentation

GC/MSD, GC/MS/MS, GC/HRMS, GC/TOF, GC/API/MS, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Identifying Unknown Chemicals and Disinfection Byproducts in Swimming Pools and Hot Tubs

Posters

| 2014 | LECO

GC/MSD, GC/HRMS, GC/TOF

Instrumentation

GC/MSD, GC/HRMS, GC/TOF

Manufacturer

LECO

Industries

Environmental

Accurate Mass Analysis of Naphthenic Acids by Argon NCI

Posters

| 2016 | Agilent Technologies

GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF

Instrumentation

GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF

Manufacturer

Agilent Technologies

Industries

Environmental

Leveraging Cl-H Mass Defect Plots for the Identification of Halogenated Organic Contaminants

Post-Target Analysis of Halogenated Flame Retardants Using Mass Defect Plots

Analysis of defective POM machine parts

Analysis of defective POM machine parts

Spectral Analysis Tools (SAT) Option for LECO Pegasus® GC-HRT+

Defect analysis of electronic devices - clouded optical components

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

GC-APCI IMS of Diesel

Identifying Unknown Chemicals and Disinfection Byproducts in Swimming Pools and Hot Tubs

Accurate Mass Analysis of Naphthenic Acids by Argon NCI

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