Library | LabRulez ICPMS

Solid Sample Holder

Brochures and specifications

| 2021 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Applications of Desorption Corona Beam Ionization-Mass Spectrometry

Posters

| 2014 | Shimadzu

LC/MS, LC/SQ

Instrumentation

LC/MS, LC/SQ

Manufacturer

Shimadzu

Industries

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

Technical notes

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Photometric linearity and range of the new generation Cary 4000/5000/6000i Spectrophotometers

Brochures and specifications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Industries

Extended Length Radial Ejection Linear Ion Traps for Higher Ion Capacity and other Modes of Mass Analysis

Posters

| 2015 | Thermo Fisher Scientific (ASMS)

LC/HRMS, LC/MS, LC/MS/MS, LC/IT

Instrumentation

LC/HRMS, LC/MS, LC/MS/MS, LC/IT

Manufacturer

Thermo Fisher Scientific

Industries

Others

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring baseline-corrected spectra on a Cary 60 UV-Vis

Technical notes

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Unique Benefits of the Small Beam Geometry of the Agilent Cary 60 UV-Visible Spectrophotometer

Technical notes

| 2014 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Eliminating the Effects of Room Temperature Fluctuations Using the Advanced TC-Optics Function in the SPD-M40 Photodiode Array Detector - Improving Baseline Stability and Analytical Precision

Technical notes

| 2019 | Shimadzu

HPLC

Instrumentation

HPLC

Manufacturer

Shimadzu

Industries

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Solid Sample Holder

Applications of Desorption Corona Beam Ionization-Mass Spectrometry

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

Photometric linearity and range of the new generation Cary 4000/5000/6000i Spectrophotometers

Extended Length Radial Ejection Linear Ion Traps for Higher Ion Capacity and other Modes of Mass Analysis

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Measuring baseline-corrected spectra on a Cary 60 UV-Vis

Unique Benefits of the Small Beam Geometry of the Agilent Cary 60 UV-Visible Spectrophotometer

Eliminating the Effects of Room Temperature Fluctuations Using the Advanced TC-Optics Function in the SPD-M40 Photodiode Array Detector - Improving Baseline Stability and Analytical Precision

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

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