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    Sea water: TN determination in the ultra trace range

    Others
    | 2005 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Environmental

    Direct swab method procedure using TOC-V and SSM-5000A

    Technical notes
    | N/A | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries

    Shimadzu OneSight Wide-Range High-Speed Detector for XRD-6100/7000

    Brochures and specifications
    | 2017 | Shimadzu
    XRD
    Instrumentation
    XRD
    Manufacturer
    Shimadzu
    Industries

    EDXRF Analysis of Cd and Pb

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Determination of active ingredi- ents in solid (pharmaceutical) dosage forms utilizing solid- state standard additions

    Applications
    | N/A | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Pharma & Biopharma

    Robust and sensitive determination of multi-elements in N-methyl-2-pyrrolidone (NMP) using ICP-OES

    Applications
    | 2023 | Thermo Fisher Scientific
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Energy & Chemicals

    Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

    Applications
    | 2015 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Freeze Cycle Testing

    Technical notes
    | 2021 | Savillex
    Consumables
    Instrumentation
    Consumables
    Manufacturer
    Savillex
    Industries

    Lead in lead-free solder – EDX-720

    Others
    | 2006 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry

    Technical notes
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
     

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