Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Integrated Second Peristaltic Pump for Improved Sample Throughput and Reduced Matrix Effects
Technical notes
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS
Technical notes
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Optimization of method conditions for high matrix samples using the Agilent 4210 MP‑AES
Technical notes
| 2016 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Maximizing Productivity in High Matrix Samples using the Agilent 7700x ICP-MS with ISIS Discrete Sampling
Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Performance Characteristics of the Agilent High Matrix Sample Introduction (HMI) Accessory for the 7500 Series ICP-MS
Technical notes
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Eliminate the Dilution Step from ICP-MS Sample Prep with the Agilent High Matrix Introduction System
Technical notes
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
On-line isotope dilution analysis with the 7700 Series ICP-MS: Analysis of trace elements in high matrix samples