Applications - page 1

ICP-OES Background and Interference Removal

Technical notes

| 2020 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Fluorescence-free 785 nm material identification with MIRA XTR DS

Technical notes

| 2021 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Homeland Security

Agilent IntelliQuant Software

Technical notes

| 2022 | Agilent Technologies

Software, ICP-OES

Instrumentation

Software, ICP-OES

Manufacturer

Agilent Technologies

Industries

Illicit Drug Trafficking and Border Control with Mira DS: Safe Fentanyl Identification

Technical notes

| 2021 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Forensics

Simplifying Correction of Doubly Charged Ion Interferences with Agilent ICP-MS MassHunter

Technical notes

| 2019 | Agilent Technologies

Software, ICP/MS

Instrumentation

Software, ICP/MS

Manufacturer

Agilent Technologies

Industries

Solving Doubly Charged Ion Interferences using an Agilent 8900 ICP-QQQ

Technical notes

| 2019 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental

On-site detection of hexavalent chromium in protective paint primers

Technical notes

| 2021 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Unmatched Removal of Spectral Interferences in ICP-MS Using the Agilent Octopole Reaction System with Helium Collision Mode

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Why does the pre-cell mass filter of the Neoma MS/MS MC-ICP-MS revolutionize collision/reaction cell technology?

Technical notes

| 2022 | Thermo Fisher Scientific

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Thermo Fisher Scientific

Industries

Other

Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

Technical notes

| 1995 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries