Applications - page 1

Bulk Analysis of Hot Dip Galvanizing Bath Using the GDS500A

Technical notes

| 2012 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications

Technical notes

| 2020 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Bulk Analysis of Tool Steels High Speed (T & M), Hot and Cold Work (H & D)

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

QDP Analysis of Galvanized Steel

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Savillex Digestion Vessels

Technical notes

| 2018 | Savillex

Sample Preparation, Consumables

Instrumentation

Sample Preparation, Consumables

Manufacturer

Savillex

Industries

Low Frequency Raman Spectroscopy

Technical notes

| 2015 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Dedicated axial or radial plasma view for superior speed and performance

Technical notes

| 2012 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes

| 2010 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Benefits of Fluoropolymers for Bioprocessing

Technical notes

| 2019 | Savillex

Consumables

Instrumentation

Consumables

Manufacturer

Savillex

Industries

Energy & Chemicals , Pharma & Biopharma

Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

Technical notes

| 1995 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries