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    Applications | LabRulez ICPMS

    Measuring baseline-corrected spectra on a Cary 60 UV-Vis

    Technical notes
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

    Technical notes
    | 2019 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction

    Technical notes
    | 2014 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    ‘Fitted’ — Fast, accurate and fully- automated background correction

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    The Linear Dynamic Range and Limits of Detection of Fluorescein using the Agilent Cary Eclipse Fluorescence Spectrophotometer

    Technical notes
    | 2014 | Agilent Technologies
    Fluorescence spectroscopy
    Instrumentation
    Fluorescence spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    The Importance of Relative Intensity Correction of Raman Data and How to Utilize it for i-Raman Series Instruments in BWSpec

    Technical notes
    | 2021 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Simplifying Correction of Doubly Charged Ion Interferences with Agilent ICP-MS MassHunter

    Technical notes
    | 2019 | Agilent Technologies
    Software, ICP/MS
    Instrumentation
    Software, ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software

    Technical notes
    | 2021 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Instrument Zero and Blank Reading on the SpectrAA Instruments

    Technical notes
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

    Technical notes
    | 1995 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
     

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    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike