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    Applications | LabRulez ICPMS

    Low reflectance measurements using the ‘VW’ technique

    Technical notes
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Fluorescence-free 785 nm material identification with MIRA XTR DS

    Technical notes
    | 2021 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Homeland Security
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