Applications - page 1

Compliance-ready MS Chromeleon CDS: customer perspectives

Others

| 2021 | Thermo Fisher Scientific

Software

Instrumentation

Software

Manufacturer

Thermo Fisher Scientific

Industries

Water in pharma and healthcare

Others

| 2020 | ELGA LabWater

Laboratory instruments

Instrumentation

Laboratory instruments

Manufacturer

ELGA LabWater

Industries

Pharma & Biopharma, Clinical Research

RAFA 2021 BOOKLET

Others

| 2021 | RAFA

GC, GC/MSD, HPLC, LC/MS

Instrumentation

GC, GC/MSD, HPLC, LC/MS

Manufacturer

Industries

Food & Agriculture

Using Elemental Fingerprints To Confirm The Geographic Origin Of Products

Others

| 2023 | Agilent Technologies

ICP/MS, ICP-OES

Instrumentation

ICP/MS, ICP-OES

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Put Agilent CrossLab to Work for You

Others

| 2022 | Agilent Technologies

Instrumentation

Manufacturer

Agilent Technologies

Industries

X-ray inspection of food products: The safety facts you need to know

Others

| 2025 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Food & Agriculture

List of Posters ESAS-CSSC 2022

Others

| 2022 | ESAS

Instrumentation

Manufacturer

Industries

PROGRAM - 8th International Symposium on RECENT ADVANCES IN FOOD ANALYSIS

Others

| 2017 | RAFA

GC, GC/MSD, HPLC, LC/MS

Instrumentation

GC, GC/MSD, HPLC, LC/MS

Manufacturer

Industries

Food & Agriculture

Agilent ICP-MS Journal (February 2015 – Issue 60)

Others

| 2015 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Energy & Chemicals

Agilent ICP-MS Journal (November 2021, Issue 86)

Others

| 2021 | Agilent Technologies

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Instrumentation

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies, Metrohm, CEM

Industries

Environmental, Food & Agriculture, Semiconductor Analysis