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Applications | LabRulez ICPMS
Spectrophotometric Spatial Profiling of Coated Optical Wafers
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Investigating the Angular Dependence of Absolute Specular Reflection
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| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The deep ultraviolet spectroscopic properties of a next-generation photoresist
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Measuring the Optical Properties of Photovoltaic Cells
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Surface Layer MALDI-MSI of Synthetic Materials on a Molecular Level
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| 2020 | Bruker
MALDI, MS Imaging, LC/TOF, LC/MS, LC/MS/MS
Instrumentation
MALDI, MS Imaging, LC/TOF, LC/MS, LC/MS/MS
Manufacturer
Bruker
Industries
Materials Testing
Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
Applications
| N/A | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
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