ELEMENTAL ANALYSIS OF DTPA-EXTRACTED MICRONUTRIENTS IN SOILS USING AN AGILENT 4210 MP-AES
Applications
| 2017 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
MEASURING LEAD IN WATER AS PER ISO:15586:2003
Applications
| 2018 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental
MILK POWDER ANALYSIS USING CHINESE GB 5413.21—2010 METHOD & AGILENT 5100 SVDV ICP-OES
Applications
| 2016 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
RAPID, NON-DESTRUCTIVE MEASUREMENT OF THE Tg OF EPOXY FRP PARTS WITH A HANDHELD FTIR