Particle Size Analysis of Polystyrene Microplastics by Single Particle (sp) ICP-MS
Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Quantitative Analysis of Fluorine by EDXRF: Powder and Fluorine-Containing Fil
Applications
| 2021 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Micro-Raman Spectroscopy in Thin Section Analysis of Rock Mineralogy
Applications
| 2019 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing
Single particle analysis using the Agilent 7700x ICP-MS
Applications
| 2013 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2016 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of Forensic Glass Samples by Laser Ablation ICP-MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Forensics
Quantifying Copper Nanoparticles on Plant Leaves using Single-Particle ICP-MS
Applications
| 2018 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ
Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions
Applications
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode