EDX-7200 New Primary Filter - Quantitative Analysis of Titanium Dioxide in Antibacterial Coatings
Applications
| 2023 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Dye, diethylene glycol, water, and surfactant content in ink
Applications
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
Cd analysis by Atomic Absorption
Applications
| N/A | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental
Identification of Dairy and Plant-Based Milks by Agilent Resolve Raman Spectroscopy
Applications
| 2024 | Agilent Technologies
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
FTIR Analysis of Recycled Plastics Using the Spectrum Advisor Function
Applications
| 2023 | Shimadzu
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Measurement of Time-dependent Change of Metal Nanoparticles
Applications
| 2018 | Shimadzu
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Measurement of Arsenic and Selenium in White Rice and River Water by Hydride Generation-Atomic Absorption Spectrometry (HG-AAS) with Electric Cell Heating
Applications
| 2015 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Environmental, Food & Agriculture
High-Speed Environmental Analysis Using the Agilent 7500cx with Integrated Sample Introduction System – Discrete Sampling (ISIS–DS)
Applications
| 2009 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module
Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Materials Testing
Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS