Agilent 8700 Laser Direct Infrared (LDIR) Chemical Imaging System for Identifying and Detecting Salt Exchange in Pharmaceutical Tablets
Applications
| 2018 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Routine Analysis of Soil Samples using ICP-MS
Applications
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Analysis of biodiesel oil (as per ASTM D6751 & EN 14214) using the Agilent 5100 SVDV ICP-OES
Applications
| 2014 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Measurement of Arsenic and Selenium in White Rice and River Water by Hydride Generation-Atomic Absorption Spectrometry (HG-AAS) with Electric Cell Heating
Applications
| 2015 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Environmental, Food & Agriculture
Measuring the purity of low volumes of DNA at 4 °C using the Agilent Cary 60 UV-Vis spectrophotometer with fiber optics microprobe
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode
Applications
| 2015 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
Application of Microwave Digestion in the Determination of Elements in Coal Fly Ash
Applications
| N/A | PreeKem
Sample Preparation, Microwave digestion
Instrumentation
Sample Preparation, Microwave digestion
Manufacturer
PreeKem
Industries
Energy & Chemicals
Determination of exchangeable cations in soil extracts using the Agilent 4100 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2012 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)