Applications | LabRulez ICPMS

UPF Evaluation of Fabric Products such as Functional Masks

Applications

| 2021 | Shimadzu

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Measuring the UV protection factor (UPF) of fabrics and clothing

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Influence of Voids on Fatigue Life of 3D Printed Titanium Alloy Specimens

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Elution Evaluation of Silver Compound-containing Antibacterial Fabric by Atomic Absorption Spectrophotometer

Applications

| 2021 | Shimadzu

AAS

Instrumentation

AAS

Manufacturer

Shimadzu

Industries

Energy & Chemicals

Identification of Forensic Fabrics Using a Portable Raman Spectrometer

Applications

| N/A | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Forensics

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

In situ, fast and sensitive: Electrochemical SERS with screen-printed electrodes

Applications

| N/A | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Quantitative Analysis of Fluorine ( 9F) by EDXRF

Applications

| 2013 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Energy & Chemicals

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Applications | LabRulez ICPMS

UPF Evaluation of Fabric Products such as Functional Masks

Measuring the UV protection factor (UPF) of fabrics and clothing

Influence of Voids on Fatigue Life of 3D Printed Titanium Alloy Specimens

Elution Evaluation of Silver Compound-containing Antibacterial Fabric by Atomic Absorption Spectrophotometer

Identification of Forensic Fabrics Using a Portable Raman Spectrometer

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

In situ, fast and sensitive: Electrochemical SERS with screen-printed electrodes

Quantitative Analysis of Fluorine ( 9F) by EDXRF

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

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