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    Applications | LabRulez ICPMS

    Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

    Applications
    | 2014 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Organic Contaminants in Sulfuric Acid using Wet Oxidation Type Total Organic Carbon Analyzer

    Applications
    | 2018 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Measurement of Oil Residues on Metal Pipes Using the TOC Solid Sample Measurement System

    Applications
    | 2017 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Characterization of Fluoropolymers Using FTIR and TG-DTA to Support the Growth of 5G

    Applications
    | 2023 | Shimadzu
    FTIR Spectroscopy, Thermal analysis
    Instrumentation
    FTIR Spectroscopy, Thermal analysis
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    EDXRF Analysis of Lead in Lead-Free Solder Materials

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Evaluation of High Intensity Lamps for AAS

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    EDXRF Analysis of Lead, Cadmium, Silver, Copper in Lead-Free Solder Materials

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Quality Control of Laminates

    Applications
    | 2021 | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Semiconductor Analysis
     

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    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike