Applications | LabRulez ICPMS

Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Mercury Concentration Accessory for US EPA Methodology

Applications

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Environmental

Mercury (Hg) Analysis by the Electrothermal Atomization Method

Applications

| N/A | Shimadzu

AAS

Instrumentation

AAS

Manufacturer

Shimadzu

Industries

Determination of active ingredi- ents in solid (pharmaceutical) dosage forms utilizing solid- state standard additions

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Pharma & Biopharma

Ultra-fast ICP-OES determination of trace elements in water, conforming to US EPA 200.7 and using next generation sample introduction technology

Applications

| 2012 | Agilent Technologies

ICP/OES

Instrumentation

ICP/OES

Manufacturer

Agilent Technologies

Industries

Environmental

EDXRF Analysis of Cd and Pb

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Improved throughput for oils analysis by ICP-OES using next generation sample introduction technology

Applications

| 2012 | Agilent Technologies

ICP/OES

Instrumentation

ICP/OES

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Near-infrared analysis of polyols: process monitoring in a hostile environment

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Energy & Chemicals

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications

| 2020 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Applications | LabRulez ICPMS

Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

Evaluation of the Mercury Concentration Accessory for US EPA Methodology

Mercury (Hg) Analysis by the Electrothermal Atomization Method

Determination of active ingredi- ents in solid (pharmaceutical) dosage forms utilizing solid- state standard additions

Ultra-fast ICP-OES determination of trace elements in water, conforming to US EPA 200.7 and using next generation sample introduction technology

EDXRF Analysis of Cd and Pb

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Improved throughput for oils analysis by ICP-OES using next generation sample introduction technology

Near-infrared analysis of polyols: process monitoring in a hostile environment

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

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