Applications - page 91

A comprehensive workflow for beverage analysis using inductively coupled plasma mass spectrometry (ICP-MS)

Applications
| 2024 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture

Al Analysis by Atomic Absorption

Applications
| N/A | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries

Double down with lentivirus titer and RNA content on Leprechaun

Applications
| 2023 | Unchained Labs
Particle characterization
Instrumentation
Particle characterization
Manufacturer
Unchained Labs
Industries
Proteomics

Expanding the analytical range utilizing 1013 Ω amplifier technology: Measurement of 100 pg Nd samples

Applications
| 2018 | Thermo Fisher Scientific
Elemental Analysis, GC/HRMS, GC/MSD
Instrumentation
Elemental Analysis, GC/HRMS, GC/MSD
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

Dealing with Matrix Interferences in the Determination of the Priority Pollutant Metals by Furnace AA

Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental

Determination of 22 Elements Following US EPA Guidelines with a New Megapixel CCD ICP-OES

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

Automated Multielement Analysis of Single Cells and Microplastics by ICP-MS with Micro-Flow Sampling

Applications
| 2023 | Agilent Technologies
Sample Preparation, ICP/MS, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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