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Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Technique for Measuring Microplastics Collected on Various Filters Using a Particle Filter Holder
Applications
| 2026 | Shimadzu
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Shimadzu
Industries
Materials Testing, Environmental
A Comparison of the Relative Cost and Productivity of Traditional Metals Analysis Techniques Versus ICP-MS in High Throughput Commercial Laboratories
Technical notes
| 2005 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Trace Metal Analysis of Waters using the Carbon Rod Atomizer — a Review
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental
Angle Resolved XPS
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Analysis of Plastic
Applications
| N/A | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing
Evaluation of the Temperature Characteristics of Toner
Applications
| 2024 | Shimadzu
Thermal Analysis
Instrumentation
Thermal Analysis
Manufacturer
Shimadzu
Industries
Materials Testing
Analysis of Phosphorus in Resin by EDX - Phosphorus Screening Analysis Kit for TSCA
Applications
| 2023 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike