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Innovations from Agilent - Improve your separations
Brochures and specifications
| 2018 | Agilent Technologies
GC columns, Consumables, LC columns
Instrumentation
GC columns, Consumables, LC columns
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Agilent Technologies
Industries
Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS
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| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Thermo Fisher Scientific
Industries
Semiconductor Analysis
Enhancing the productivity of food sample analysis with ICP-MS
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| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
Industries
Food & Agriculture
Fast Scanning Sector Field ICP-MS with Laser Ablation for the Multi-Element Analysis of Elephant Tusk
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| 2003 | Thermo Fisher Scientific
Laser ablation, ICP/MS
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Laser ablation, ICP/MS
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Thermo Fisher Scientific
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Materials Testing
Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
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| 2003 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
Leave Interferences Behind With MS/MS
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| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Penetrometer PNR 12
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| 2024 | Anton Paar
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Laboratory instruments
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Anton Paar
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Materials Testing
ICPMS-2040/2050 Supplies and Maintenance Parts
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| 2024 | Shimadzu
ICP/MS
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ICP/MS
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Shimadzu
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High precision copper and zinc isotopes with Neoma MS/MS MC-ICP-MS
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| 2023 | Thermo Fisher Scientific
ICP/MS
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ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS
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| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
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