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Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II
Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Measuring Elemental Impurities in Pharmaceutical Materials
Brochures and specifications
| 2022 | Agilent Technologies
Consumables, ICP/MS, ICP-OES
Instrumentation
Consumables, ICP/MS, ICP-OES
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Using ICP-QQQ for UO2 + product ion measurement to reduce uranium hydride ion interference and enable trace 236U isotopic analysis
Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Energy & Chemicals
DST-1000 / DST-4000 Frequently Asked Questions
Others
| 2016 | Savillex
Sample Preparation
Instrumentation
Sample Preparation
Manufacturer
Savillex
Industries
Radiation Monitoring and Detection Certified Training Catalog
Brochures and specifications
| 2016 | Thermo Fisher Scientific
Other
Instrumentation
Other
Manufacturer
Thermo Fisher Scientific
Industries
Composite heat damage measurement using the handheld Agilent 4100 ExoScan FTIR
Applications
| 2015 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Measuring Diamond-like Carbon Films by Dispersive Raman Spectroscopy
Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike