Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

Applications
| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

List of Posters ESAS-CSSC 2022

Others
| 2022 | ESAS
Instrumentation
Manufacturer
Industries

Analysis of Tapwater Contaminants by FTIR and EDX Spectroscopy

Applications
| 2016 | Shimadzu
FTIR Spectroscopy, X-ray
Instrumentation
FTIR Spectroscopy, X-ray
Manufacturer
Shimadzu
Industries
Environmental

Exploration and Mining of Rare Earth Elements (REE) Using Tube-Based Thermo Scientific Portable XRF Analyzers

Applications
| 2012 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

GCC: Best practices for the analyses of complex samples by ICP-OES and ICP-MS: Streamline workflow for accurate results

Presentations
| 2022 | Thermo Fisher Scientific
Sample Preparation, ICP/MS, ICP-OES, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP-OES, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Understanding the Glow Discharge Source

Technical notes
| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Gaining Deeper Insights into Thin Film Response

Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

Posters
| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Simple Steps for Clearing a Blocked ICP-OES Nebulizer

Technical notes
| 2018 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike