Library - page 67 | LabRulez ICPMS

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Cytosolic expression of Green Fluorescent Protein (GFP) and its derivatives in the yeast Saccharomyces cerevisiae: Detection in vivo using the Agilent Cary Eclipse

Applications

| 2011 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Clinical Research

Simultaneous N, C and S Isotope Ratio Determination on a DELTA V Isotope Ratio MS using a Flash Elemental Analyzer

Applications

| 2011 | Thermo Fisher Scientific

Elemental Analysis, GC/HRMS, GC/MSD

Instrumentation

Elemental Analysis, GC/HRMS, GC/MSD

Manufacturer

Thermo Fisher Scientific

Industries

Energy & Chemicals

Sensitivity Enhancement for Flame AAS Using an Atom Concentrator Tube for Elements Dissolved in Organic Solvents

Applications

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

High-Speed Environmental Analysis Using the Agilent 7500cx with Integrated Sample Introduction System – Discrete Sampling (ISIS–DS)

Applications

| 2009 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Thermo Scientific Niton XL3t

Brochures and specifications

| 2009 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Energy & Chemicals

Increased Throughput Using Snapshot Spectra

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

The DXR Raman Microscope for High-Performance Raman Microscopy

Applications

| 2008 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy, Software

Instrumentation

RAMAN Spectroscopy, Microscopy, Software

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis