Measurement of Acrylamide in Potato Chips by Portable FTIR Analyzers
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
STANDARD CLEANING AND CALIBRATION PROCEDURE FOR TGA-50(H) AND TGA-51(H)
Applications
| N/A | Shimadzu
Thermal Analysis
Instrumentation
Thermal Analysis
Manufacturer
Shimadzu
Industries
Materials Testing
Direct Analysis of Zirconium-93 in Nuclear Site Decommissioning Samples by ICP-QQQ
Applications
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ
Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Use of Sample Preparation Tools in Mining and Mineral Exploration Projects
Applications
| 2012 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
Determination of Lead in Unleaded Gasoline on the Liberty Series II ICP-OES with the Axially-Viewed Plasma
Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
High-Throughput Multi-Elemental Analysis of Crude Oil
Applications
| 2019 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Multi-Element Analysis of Trace Metals in Animal Feed using ICP-OES
Applications
| 2018 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies, CEM
Industries
Food & Agriculture
Agilent 7900 ICP-MS simplifies drinking water analysis
Applications
| 2014 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)