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Analysis of Black Mass Using ICPE-9800 for Enhancing Accuracy of EDX-7200 Results
Applications
| 2024 | Shimadzu
ICP-OES, X-ray
Instrumentation
ICP-OES, X-ray
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Combining full spectrum read-out and innovative automation capabilities for the robust and fast analysis of major and trace elements in fertilizers using ICP-OES
Applications
| 2024 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Agilent Cary 3500 UV-Vis spectrophotometer series
Brochures and specifications
| 2023 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Composition characterization of lithium-rich minerals as an exploitable source of lithium using ICP-OES
Applications
| 2022 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
Fast Determination of Inorganic Arsenic (iAs) in Food and Animal Feed by HPLC-ICP-MS
Applications
| 2019 | Agilent Technologies
HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Total elemental analysis of food samples using the Thermo Scientific iCAP TQ ICP-MS with autodilution
Applications
| 2017 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture
Determination of V, Ni, and Fe in Crude Oils and Bitumen using Sequential ICP-OES and Scandium as an Internal Standard
Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Measuring Inorganic Impurities in Semiconductor Manufacturing
Guides
| 2022 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike