Library - page 61 | LabRulez ICPMS

MATRIX-MG Series Automated High-Performance Gas Analyzers

Brochures and specifications

| 2017 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Energy & Chemicals

K-Alpha: A New Concept in XPS

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

FTIR Talk Letter (vol. 42)

Others

| 2024 | Shimadzu

FTIR Spectroscopy, RAMAN Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, RAMAN Spectroscopy, Microscopy

Manufacturer

Shimadzu

Industries

Energy & Chemicals

Agilent ICP-MS Journal (March 2006 – Issue 26)

Others

| 2006 | Agilent Technologies

ICP/MS, Speciation analysis

Instrumentation

ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

AAV Aggregate Quantitation and Identification with the Aura System

Applications

| 2025 | Waters

Particle characterization, Microscopy

Instrumentation

Particle characterization, Microscopy

Manufacturer

Waters

Industries

Pharma & Biopharma

Characterization of Biomolecules using High-Performance UV-Vis Spectrophotometry

Applications

| 2024 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma, Clinical Research

Fast ICP-MS method for determination of heavy elements in different types of food matrices

Posters

| 2019 | Shimadzu (ASMS)

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Shimadzu

Industries

Food & Agriculture

X-ray Microanalysis Family

Brochures and specifications

| 2019 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

NEAFS: Portable and Handheld FTIR

Presentations

| 2017 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Forensics

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis