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Applications - page 57
High Volume Optical Component Testing
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Materials Testing
In-Situ 13C/12C Ratio Analysis in Water Carbonates using FTIR
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| 2017 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Environmental
Mix Ratio Identification in Industrially Significant Two-Part Coating Systems Using the Agilent 4300 Handheld FTIR
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| 2015 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Materials Testing
Analysis of plasma treated carbon fiber reinforced polymer (CFRP) composites by portable Fourier Transform Infrared Spectroscopy (FTIR)
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| 2015 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Materials Testing
Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Materials Testing
Study of False Alarm Rates on Bottled Water Using the Cobalt Insight Range by Agilent
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| 2018 | Agilent Technologies
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Agilent Technologies
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Homeland Security
Improved Measurement of Liquid Samples Using FTIR
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| 2021 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Energy & Chemicals
Ultra-fast ICP-OES determinations of soil and plant material using next generation sample introduction technology
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| 2012 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies, CEM
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Environmental
MILK POWDER ANALYSIS USING CHINESE GB 5413.21—2010 METHOD & AGILENT 5100 SVDV ICP-OES
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| 2016 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Food & Agriculture
Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
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| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
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