Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Fast and Accurate Speciation of Mercury in Milk and Honey Food Products by HPLC-ICP-MS
Applications
| 2021 | Agilent Technologies
HPLC, ICP/MS, Speciation analysis
Instrumentation
HPLC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Evaluating HILIC Stationary Phases for Oligonucleotide Separation by LC/MS
Applications
| 2025 | Agilent Technologies
Consumables, LC columns, LC/MS, LC/MS/MS, LC/TOF, LC/HRMS
Instrumentation
Consumables, LC columns, LC/MS, LC/MS/MS, LC/TOF, LC/HRMS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ
Applications
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Analysis of pharmaceuticals and drug related impurities using Agilent instrumentation
Guides
| 2010 | Agilent Technologies
GC, GC/MSD, HeadSpace, GC/SQ, HPLC, Ion chromatography, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ, ICP/MS
Instrumentation
GC, GC/MSD, HeadSpace, GC/SQ, HPLC, Ion chromatography, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ, ICP/MS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Determination of Metals in Cannabis and Cannabis-related Samples using ICP-OES and ICP-MS
Posters
| 2018 | Agilent Technologies (AOAC)
ICP/MS, ICP-OES
Instrumentation
ICP/MS, ICP-OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Routine Analysis of Rare Earth Elements in Basalt using ICP-MS
Applications
| 2026 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Operation of the Angle Resolving Lens on Theta Probe
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
Follow us
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike