Applications - page 56

Unmatched Removal of Spectral Interferences in ICP-MS Using the Agilent Octopole Reaction System with Helium Collision Mode

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Achieving Optimum Throughput in ICP-MS Analysis of Environmental Samples with the Agilent 7500ce ICP-MS

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Quantitative Depth Profile (QDP) Analysis of Plated Samples

Technical notes

| 2006 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Automatic Power-Outage Recovery with an Antaris Process FT-NIR Analyzer and RESULT Software

Technical notes

| 2006 | Thermo Fisher Scientific

NIR Spectroscopy, Software

Instrumentation

NIR Spectroscopy, Software

Manufacturer

Thermo Fisher Scientific

Industries

Other

Monitoring and Controlling Powder Blending Online at AstraZeneca

Technical notes

| 2006 | Thermo Fisher Scientific

NIR Spectroscopy, Software

Instrumentation

NIR Spectroscopy, Software

Manufacturer

Thermo Fisher Scientific

Industries

Pharma & Biopharma

A Comparison of the Relative Cost and Productivity of Traditional Metals Analysis Techniques Versus ICP-MS in High Throughput Commercial Laboratories

Technical notes

| 2005 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Applications of ICP-MS in Homeland Security

Technical notes

| 2004 | Agilent Technologies

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Homeland Security

Introduction to Laser Ablation ICP-MS for the Analysis of Forensic Samples

Technical notes

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

Technical notes

| 1995 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Metrologická návaznost analytických výsledků

Technical notes

| N/A | Eurachem

Other

Instrumentation

Other

Manufacturer

Industries