Identification of Copper Concentrates Using EDX and XRD

Applications
| 2021 | Shimadzu
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Shimadzu
Industries
Materials Testing

Leaching Test of Sb and Ge from PET by Graphite Furnace Atomic Absorption Spectrophotometry (GF-AAS)

Applications
| 2021 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Energy & Chemicals

Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software

Technical notes
| 2021 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Analysis of Amino Acids by KBr Tablet Method

Applications
| 2020 | Shimadzu
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Pharma & Biopharma

Direct Analysis of Metallic Elements in Cell Culture Medium by Atomic Absorption Spectrophotometry (AAS)

Applications
| 2020 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Pharma & Biopharma

Determination of Oxygen, Nitrogen, and Hydrogen in Iron, Steel, Nickel-base, and Cobalt-base Alloys: Optimizing Cycle Time and Analytical Performance

Applications
| 2020 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Oxygen and Nitrogen in Solid Iron, Steel, Nickel-Base, and Cobalt-Base Alloys

Applications
| 2019 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Improve Data Integrity and Remove Analytical Variables in UV-Vis Measurements

Applications
| 2019 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

FACT spectral deconvolution

Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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