ICPMS
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Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Obtaining Optimum Performance When Using the SIPS Accessory

Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries

Food contact materials

Guides
| 2018 | Thermo Fisher Scientific
GC, GC/MSD, GC/MS/MS, GC/HRMS, GC/SQ, GC/QQQ, GC/Orbitrap, HPLC, LC/HRMS, LC/MS, LC/MS/MS, LC/Orbitrap, DART, ICP/MS, FTIR Spectroscopy
Instrumentation
GC, GC/MSD, GC/MS/MS, GC/HRMS, GC/SQ, GC/QQQ, GC/Orbitrap, HPLC, LC/HRMS, LC/MS, LC/MS/MS, LC/Orbitrap, DART, ICP/MS, FTIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture, Materials Testing

Leave Interferences Behind With MS/MS

Brochures and specifications
| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent 7700 Series ICP-MS

Brochures and specifications
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries

Analysis of Electroceramics by Laser Ablation ICP-MS

Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications
| 2020 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Take a peek inside your AAV capsid with Stunner

Applications
| 2020 | Unchained Labs
Particle characterization, Particle size analysis, UV–VIS spectrophotometry
Instrumentation
Particle characterization, Particle size analysis, UV–VIS spectrophotometry
Manufacturer
Unchained Labs
Industries
Proteomics , Lipidomics
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike