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Waldner Secuflow laboratory fume cupboards
Brochures and specifications
| 2018 | Waldner
Laboratory equipment
Instrumentation
Laboratory equipment
Manufacturer
Industries
Decarburization Depth Analysis Using Microindentation Hardness Testing
Applications
| 2019 | LECO
Mechanical testing, Sample Preparation, Microscopy
Instrumentation
Mechanical testing, Sample Preparation, Microscopy
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Determination of amine number and solid content of dipping paint
Applications
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
High-Speed Imaging of Arc Behavior in Lightning Strike Tests
Applications
| 2026 | Shimadzu
Laboratory instruments
Instrumentation
Laboratory instruments
Manufacturer
Shimadzu
Industries
Materials Testing
Cement Clinkers
Applications
| 2021 | LECO
Mechanical testing, Sample Preparation, Microscopy
Instrumentation
Mechanical testing, Sample Preparation, Microscopy
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
XPS characterization of a membrane electrode assembly from a proton exchange fuel cell
Applications
| 2018 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Using qualifier ions to improve ICP-MS data quality for waste water analysis
Technical notes
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Instruments for Analyzing / Evaluating Electronic Device
Brochures and specifications
| 2022 | Shimadzu
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Instrumentation
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Semiconductor Analysis
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike