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Applications - page 48

Flame Photometric Analysis with Wavelength Shift Using AA-7000

Technical notes
| N/A | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries

Direct swab method procedure using TOC-V and SSM-5000A

Technical notes
| N/A | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries

Measurement of Transmittance Distribution Map of Sample Plane

Technical notes
| N/A | Shimadzu
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries

Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700

Technical notes
| N/A | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries

Improvements in Detection Limits in Atomic Absorption Spectroscopy using the new digitally controlled Graphite Furnace - GFA-7000

Technical notes
| N/A | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries

Not all FT-IR Spectrometers are the Same: High Energy Throughput

Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries

Digital Signal Processing in Polarization Modulation - Infrared Reflection Absorption Measurements

Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries

Not all FT-IR Spectrometers are the same: Sealing and Dessication

Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries

Calibration model transfer of caffeine on the NIRS XDS Rapid Content Analyzer

Technical notes
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries

Increase the accuracy of your NIR measurements with instrument calibration

Technical notes
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
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