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Applications - page 48
Flame Photometric Analysis with Wavelength Shift Using AA-7000
Technical notes
| N/A | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Direct swab method procedure using TOC-V and SSM-5000A
Technical notes
| N/A | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Measurement of Transmittance Distribution Map of Sample Plane
Technical notes
| N/A | Shimadzu
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700
Technical notes
| N/A | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Improvements in Detection Limits in Atomic Absorption Spectroscopy using the new digitally controlled Graphite Furnace - GFA-7000
Technical notes
| N/A | Shimadzu
AAS
Instrumentation
AAS
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Shimadzu
Industries
Not all FT-IR Spectrometers are the Same: High Energy Throughput
Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Digital Signal Processing in Polarization Modulation - Infrared Reflection Absorption Measurements
Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Not all FT-IR Spectrometers are the same: Sealing and Dessication
Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Calibration model transfer of caffeine on the NIRS XDS Rapid Content Analyzer
Technical notes
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Increase the accuracy of your NIR measurements with instrument calibration
Technical notes
| N/A | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
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