Applications - page 46

Measuring Relative % Reflectance of Small Samples in a Cary 50 Spectrophotometer

Technical notes

| 2007 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Glow Discharge Atomic Emission Spectrometry and its Performance in Accordance with ASTM E415

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Energy & Chemicals , Materials Testing

Routine Analysis of "Difficult" Alloys Using LECO Glow Discharge

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Bulk Analysis of Fasteners Using 2 mm Lamp (Rivet, Screw and Bolt)

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Analysis of Stainless Steels (Corrosion and Heat-Resistant Steels)

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Quantitative Depth Profile (QDP) Analysis of Aluminum Clad

Technical notes

| 2007 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Understanding RoHS

Technical notes

| 2006 | Shimadzu

Other

Instrumentation

Other

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative Depth Profile (QDP) Analysis of Plated Samples

Technical notes

| 2006 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Unmatched Removal of Spectral Interferences in ICP-MS Using the Agilent Octopole Reaction System with Helium Collision Mode

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Achieving Optimum Throughput in ICP-MS Analysis of Environmental Samples with the Agilent 7500ce ICP-MS

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental