Applications - page 44

Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Well to well repeatability using a white 96 well microplate

Technical notes

| 2011 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Fluorescence room light immunity with the Agilent Cary Eclipse

Technical notes

| 2011 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Imaging - what is it and how is it implemented?

Technical notes

| 2011 | Agilent Technologies

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Agilent Technologies

Industries

Understanding Calibration for Glow Discharge Atomic Emission Spectrometry (GD-AES)

Technical notes

| 2011 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Bulk Analysis of Cast and Wrought Aluminum Alloys

Technical notes

| 2011 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Graphite Tube Atomizer Performance – ASTM Graphite Furnace Round Robin for Water

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Features and Operation of Hollow Cathode Lamps and Deuterium Lamps

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries